Characterization Techniques for Metal Chalcogenide Thin Films: Review
Since it could be used in diverse applications such as optoelectronics, solar cells, laser devices and gas sensors, thin films have attracted immense interest. To characterize the properties of the thin films obtained, X-ray photoelectron spectroscopy, Raman spectroscopy, Fourier transform infrared spectroscopy, UV-visible spectrophotometer and energy dispersive x-ray have been used in this work. In order to determine the good quality of the films obtained, a combinatorial characterization approach is usually needed. The main purpose of this chapter of the book is to summarize the benefits, drawbacks and experimental findings illustrated by these instruments available for thin film characterization.
Author (s) Details
Ho Soon Min
Center for American Education, INTI International University, Putra Nilai, 71800, Negeri Sembilan, Malaysia.
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