TEM Cross-Section Sample (XTEM) Preparation of nc-Si/a-SiO2 Multi-Layer Thin Film Using cryo Ar+ Ion Slicing for Microstructural Analyses
Third generation solar cell researchers are paying close attention to thin films of multi-layered nanocrystalline silicon (nc-Si). The multi-layered amorphous hydrogenated a-Si:H/a-SiO2 films created by...